Microtome with micro-plane and electric contact reference

Details Microtome with micro-plane and electric contact reference Microtome with micro-plane and electric contact reference

1990-11-09

1994-02-01

Phan, Hien H.

Cutting

Processes

83 42, 83370, 839155, G01N 106

Patent

active

052824047

ABSTRACT:
A microtome for cutting thin sample sections utilizes an electrical contact or sole plate for guiding the section cutting knife during sectioning. The sole plate floats across the surface of the sample thereby ensuring that uniformly thin sections are cut regardless of movement of the sample or expansion or contraction thereof. An electrical contact may be used to detect and reference contact between the sample surface and the section cutting knife. After contact between the sample surface and section cutting knife is referenced, the relative position between the sample surface and section cutting knife may be adjusted to achieve a desired section thinness.

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Cocks et al., "A Cantilever Microtome for Precision Sectioning in Electron and Light Microscopy", The Review of Scientific Instruments, vol. 23, No. 11 (Nov., 1952), pp. 615-618.
Echlin et al., "Low Temperature Techniques for Scanning Electron Microscopy", Conference: Scanning Electron Microscopy, Part I (Apr. 1976), pp. 753-762.

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