Microstructural feature and material property monitoring...

Details Microstructural feature and material property monitoring... Microstructural feature and material property monitoring...

2007-01-11

2010-10-26

Chowdhury, Tarifur (Department: 2886)

Optics: measuring and testing

By light interference

For dimensional measurement

Reexamination Certificate

active

07821645

ABSTRACT:
A microstructural feature and material property monitoring device for a metallic material that can easily adjust relative position between an irradiation position of laser beams applied to the metallic material to propagate pulsed ultrasonic waves in the metallic material and detection position of a laser interferometer, and therefore can accurately monitor the microstructural feature and material property of the metallic material. The device relatively moves the irradiation position of the laser beams generated by a laser oscillator and the detection position of the laser interferometer. The irradiation position of the laser beams generated from a laser oscillator and the detection position of the laser interferometer are controlled to be aligned with a relative position according to the microstructural feature and material property of the metallic material based on the time from the transmission of the pulsed ultrasonic waves to the detection by the laser interferometer. After the alignment, the microstructural feature and material property of the metallic material is calculated based on the waveform of the pulsed ultrasonic waves generated as an electrical signal by the laser interferometer.

REFERENCES:
patent: 5824908 (1998-10-01), Schindel et al.
patent: 6628404 (2003-09-01), Kelley et al.
patent: 2 172 106 (1986-09-01), None
patent: 53-126991 (1978-11-01), None
patent: 56-58659 (1981-05-01), None
patent: 7-20095 (1995-01-01), None
patent: 2000-146923 (2000-05-01), None
patent: 2002-213936 (2002-07-01), None
patent: 2003-329652 (2003-11-01), None
patent: 2004-333169 (2004-11-01), None
patent: WO 02/103347 (2002-12-01), None

Affiliated with

Also associated with

Rating

Microstructural feature and material property monitoring... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Microstructural feature and material property monitoring..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microstructural feature and material property monitoring... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4208211