Microscopy method and microscope

Optics: measuring and testing – By light interference – For refractive indexing

Reexamination Certificate

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Reexamination Certificate

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07812967

ABSTRACT:
The present invention provides a microscopy method and a microscope, which enable microscopic observation of desired information of a specimen with an extremely high S/N ratio in a short period of time without increasing intensity of a light sources. The method of the invention is characterized in that it comprises: a simultaneous irradiation step of irradiating a specimen with first and second electromagnetic rays having different wave length with the rays overlapping at least partly each other; and a simultaneous irradiation visualization step of visualizing a spatial distribution of a refractive index variation caused by the irradiation of the first electromagnetic ray as a phase contrast image of the second electromagnetic ray having passed through the specimen in the region of the specimen to which the overlapped the first and the second electromagnetic rays are irradiated.

REFERENCES:
patent: 3999854 (1976-12-01), Barrett
patent: 5731588 (1998-03-01), Hell et al.
patent: 5777342 (1998-07-01), Baer
patent: 5866911 (1999-02-01), Baer
patent: 6122058 (2000-09-01), Van Der Werf et al.
patent: 6157320 (2000-12-01), Yujiri et al.
patent: 6194486 (2001-02-01), Yujiri et al.
patent: 6667830 (2003-12-01), Iketaki et al.
patent: 6859313 (2005-02-01), Iketaki et al.
patent: 7388668 (2008-06-01), Potma et al.
patent: 199 80 759 (2001-10-01), None
patent: 10-331122 (1998-12-01), None
patent: 3020453 (2000-01-01), None

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