Microscopy

Details Microscopy Microscopy

2006-11-28

2006-11-28

Lee, Hwa (Andrew) (Department: 2877)

Optics: measuring and testing

By light interference

Reexamination Certificate

active

07142308

ABSTRACT:
A method and apparatus for analyzing a sample are provided. The method can include the steps of: (i) irradiating the sample with a beam of radiation in which at least some of the radiation results in the excitation of surface waves, (ii) exciting surface waves which are confined to an area having a principal dimension comparable to the wavelength of the surface waves, (iii) detecting radiation which includes radiation produced by the surface waves, and (iv) analyzing the detected radiation.

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