Microscopic system for examination of crystal cleavage plane

Details Microscopic system for examination of crystal cleavage plane Microscopic system for examination of crystal cleavage plane

1992-01-10

1993-08-24

Evans, F. L.

Optics: measuring and testing

Crystal or gem examination

Axes determination

2502013, G01N 2100

Patent

active

052393550

ABSTRACT:
An optical microscope equipped with an optical device allowing a convergent beam to irradiate the surface of a specimen through a microscope tube and an objective lens. The device detects the deviation of the convergent beam reflected from the surface of the specimen to an optical axis of the microscope. A driving mechanism moves the specimen in a three-dimensional direction to automatically eliminate the deviation. With this microscope, it is possible to position the specimen automatically, thus reducing the time for examination and improving precision of the examination.

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