Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate
2011-01-11
2011-01-11
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
By polarized light examination
With polariscopes
C356S600000, C356S601000, C715S836000, C715S856000, C715S849000
Reexamination Certificate
active
07869039
ABSTRACT:
A microscopic-measurement apparatus capable of conducting measurement successively in several set areas regardless of the type of stage driving system or the precision of the stage driving system. The microscopic-measurement apparatus for acquiring optical information from desired portions of a sample by moving a measuring optical axis on a surface of the sample includes an observation-image display section for displaying a sample surface image as an observation image, in a range of visual field which is observable at a present sample position; an optical-axis display section for displaying areas to be measured and a present position of the measuring optical axis in an overlapped state with the observation image; an area setting section capable of setting measuring areas by expanding, reducing, changing in shape and moving the areas to be measured; and an optical-information acquisition section for measuring one set measuring area or several set measuring areas successively with an instruction of starting measurement.
REFERENCES:
patent: 3705755 (1972-12-01), Baer
patent: 5192980 (1993-03-01), Dixon et al.
patent: 6141100 (2000-10-01), Burka et al.
patent: 7224460 (2007-05-01), Soga et al.
patent: 2002/0041439 (2002-04-01), Engelhardt et al.
patent: 2005/0248837 (2005-11-01), Sase et al.
patent: 2006/0164633 (2006-07-01), Koshoubu et al.
patent: 2008/0282197 (2008-11-01), Yumoto et al.
patent: 1209504 (2002-05-01), None
patent: 2006-208016 (2006-08-01), None
Japanese Patent Abstract Publication No. 04-348254, Published Dec. 12, 1992, One page.
Commonly owned U.S. Appl. No. 11/337,817, filed Jan. 23, 2006, 22 pages.
European Search Report for EP 08167147 mailed Jan. 22, 2009, three pages.
Akao Kenichi
Koshoubu Jun
Alli Iyabo S
Jasco Corporation
Rankin , Hill & Clark LLP
Toatley Gregory J
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