Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2006-08-22
2006-08-22
Lee, Hwa (Andrew) (Department: 2877)
Optical: systems and elements
Compound lens system
Microscope
C356S317000, C250S458100
Reexamination Certificate
active
07095556
ABSTRACT:
A microscope capable of being shaped into a beam with complete hollow shape by removing the disorder of the wavefront to the erase light, particularly, and capable of improving the spatial resolution by inducing a super-resolution near the limit, is provided. In the microscope, wherein a first light to excite a molecule from a ground-state to first electron excited state or a second light to excite the molecule from the first electron excited state to the second electron excited state with higher energy level, for a sample56including the molecule with three electronic states including at least a ground-state, are spatial phase-modulated into the prescribed beam shape, and parts of these first light and the second light are overlapped and focused to detect luminescence from the sample56, a wavefront compensation means61is provided in the optical path of the first light and/or in the optical path of the second light, and the wavefront aberration caused in the first light and/or in the second light, is removed by the wavefront compensation means61.
REFERENCES:
patent: 6859313 (2005-02-01), Iketaki et al.
Fujii Masaaki
Igasaki Yasunori
Iketaki Yoshinori
Suzuki Toshio
Watanabe Takeshi
Detschel Marissa J
Frishauf, Holtz, Goodman & Chick, PC
Hamamatsu Photonics K,K,
Japan Science and Technology Agency
Lee Hwa (Andrew)
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