Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2008-01-22
2008-01-22
Lee, Hwa (Andrew) (Department: 2886)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C356S317000
Reexamination Certificate
active
11054441
ABSTRACT:
A microscope includes a photon source which sequentially generates sets of quantum-mechanically entangled photons including at least two photons, a lens which focuses a set of photons, an actuator which varies a relative distance between a focal position of the lens and a specimen with a minute displacement, a detector detecting photons transmitted through or scattered by the specimen, and a counter counting coincidence detections of n-numbers of photons with the detector during a gating time which is set so that a rate that a number of photons detected during thereof belong to a single set of quantum-mechanically entangled photons exceeds a predetermined rate depending on the varied relative distance.
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Fujii Mikio
Goto Hayato
Ichimura Kouichi
Ohkuma Kenji
Torii Kentaro
Kabushiki Kaisha Toshiba
Lee Hwa (Andrew)
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