Microscope system

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S368000, C359S382000

Reexamination Certificate

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06980359

ABSTRACT:
In a microscope system in which at least one of a stage on which a sample4is mounted and an objective lens6can move relatively in a direction of an optical axis, a contact judgment section12judges the possibility of contact between the sample4and the objective lens6based on a result of comparison between a detection output from a contact sensor11which detects contact between the sample4and the objective lens6and a preset threshold value, excessive contact between the sample4and the objective lens6is avoided based on a result of this judgment, and a threshold value in the contact judgment section12is updated based on the output from the contact sensor11every predetermined time.

REFERENCES:
patent: 5783814 (1998-07-01), Fairley et al.
patent: 6043475 (2000-03-01), Shimada et al.
patent: 6507433 (2003-01-01), Mecham et al.
patent: 6628459 (2003-09-01), Ue
patent: 05-026612 (1993-02-01), None
patent: 08-129136 (1996-05-01), None
patent: 10-260361 (1998-09-01), None
patent: 2000-199858 (2000-07-01), None

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