Microscope optical system and method for microscopic examination

Details Microscope optical system and method for microscopic examination Microscope optical system and method for microscopic examination

1984-08-14

1986-01-07

Corbin, John K.

G02B 702

Patent

active

045630623

ABSTRACT:
A microscope optical system for observation of test object, comprises an objective lens and a compensator provided to be inserted into and retracted from the optical path of the objective lens. The compensator is inserted into the optical path according to the change of the optical path length of the medium between the object lens and object to maintain good image forming performance irrespective of such change of the optical path length.

REFERENCES:
patent: 2237943 (1941-04-01), Lihotzky
patent: 3481665 (1969-12-01), Rosenberger
patent: 3493290 (1970-02-01), Traub
patent: 3709579 (1973-01-01), Makosch
patent: 4208099 (1980-06-01), Tojyo

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