Microscope for producing high resolution images without precisio

Details Microscope for producing high resolution images without precisio Microscope for producing high resolution images without precisio

1983-10-03

1986-04-22

Westin, Edward P.

Radiant energy

Photocells; circuits and apparatus

Interference pattern analysis

250573, 350509, 356359, G02B 2106

Patent

active

045844844

ABSTRACT:
A microscope, not employing conventional optical elements, is disclosed wherein a sample under examination is subjected to a moving pattern of illumination having alternate light and dark interference fringes, and having a spatial frequency which varies during the motion of the fringes over the sample in a first direction, in order to obtain the sine components of the optical image of the sample. The light reflected off of the sample is gathered by a wide angle light detector to produce electrical signals which in turn result in the recording of a set of signals proportional to the intensity of the light reflected from the sample during a plurality of signal sampling intervals. Another set of signals is recorded after the direction of relative motion between the pattern and the sample is changed by about 1.degree., for example, and so on until electrical data is recorded for a considerable number of "fourier slices" across the sample object. Data indicative of the phase and amplitude values of the fourier components of the resulting signals is extracted, and fourier transformation is thereafter carried out for producing image data enabling the high resolution reconstruction of the optical image of the specimen.

REFERENCES:
Preater; "In-Plane Strain Measurement on Large Rotating Structures"; Electro-Optics/Laser International '80 UK; Mar. 25-27, 1980; pp. 133-138.
Jones; "The Design and Application of a Speckle Pattern Interferometer for Total Plane Strain Field Measurement"; Optics & Laser Tech.; Oct. '76; vol. 8, No. 5, pp. 215-219.

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