Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2006-11-09
2009-08-11
Nguyen, Thong (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S368000, C359S385000
Reexamination Certificate
active
07573635
ABSTRACT:
There is provided a method for a microscope device for optionally examining a sample by at least a first light beam bundle from a first direction or a second light beam bundle from a second direction different to the first direction, having a microscope objective and a beam deflection element, wherein the beam deflection element is operable by a drive in order to optionally couple the first light beam bundle or the second light beam bundle into the microscope objective, and wherein the beam deflection element is rotatable by the drive in order to optionally change at least an exit direction of the first light beam bundle from the beam deflection element if the first light beam bundle is coupled into the microscope objective.
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Nguyen Thong
Roberts Mlotkowski Safran & Cole P.C.
Safran David S.
TILL I.D. GmbH
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