Microscope device

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S371000, C359S385000

Reexamination Certificate

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11003428

ABSTRACT:
Specularly reflected light from a convergence position on an object surface31enters a second critical-angle prism14, another prism15, and a first critical-angle prism13of a parallel beam selection optical system20in this order as a parallel beam traveling along the optical axis. The critical-angle prisms13, 14have critical angles of 45 degrees with respect to the wavelength of the light beam. Light beams other than the parallel light beam are removed at oblique surfaces13a,14a of the critical-angle prisms13, 14, thereby allowing only the parallel light beam to exit as a regular light beam. This parallel beam is formed into a convergent light by a collimator lens12, reflected by a half prism11and converged on an image pickup surface of an image pickup device52. In this way, unnecessary noise light can be removed without placing a pin hole plate such as that placed before the image pickup plane in a confocal microscope.

REFERENCES:
patent: 4746203 (1988-05-01), Nishioka et al.
patent: 4930896 (1990-06-01), Horikawa
patent: 5120953 (1992-06-01), Harris
patent: 5132526 (1992-07-01), Iwasaki
patent: 5162648 (1992-11-01), Iwasaki
patent: 5939709 (1999-08-01), Ghislain et al.
patent: 6642504 (2003-11-01), Cathey, Jr.
patent: 2001-350098 (2001-12-01), None

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