Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-09-26
2000-06-27
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
3562434, 359368, 25055929, 606130, 1286531, G01B 1114
Patent
active
060813369
ABSTRACT:
A microscope calibrator includes a housing supporting a series of focusing targets each situated at a predetermined distance from one another. Attributes of the microscope are determined by focusing the microscope on one ore more of the focusing targetrs and determining a location of the microscope with respect to the focusing targets focused upon. The position of the focusing targets are determinable by virtue of a local reference frame target attached to the microscope calibrator or by using a tracked probe to communicate the location of each point focused upon by the microscope on each of the focusing targets.
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Messner Dale A.
Quddus Ruhul
Schellenberg John D.
Clair Eugene E.
Fry John J.
Gurin Timothy B.
Pham Hoa Q.
Picker International Inc.
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