Microscope calibration apparatus and method and stage...

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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C359S391000, C359S396000

Reexamination Certificate

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07848019

ABSTRACT:
A stage for supporting a specimen slide and for calibrating a microscope includes a base and a calibration component integral with the base. The calibration component includes at least one calibration element for positional calibration and at least one calibration element for optical calibration. Calibration of the microscope can be performed without the need for independent calibration slides. The calibration component may be a glass calibration component or may be defined by a calibration element formed or etched through the base.

REFERENCES:
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patent: 5499097 (1996-03-01), Ortyn et al.
patent: 2006/0028716 (2006-02-01), Gilbert
patent: 2007/0139638 (2007-06-01), Wolpert et al.
patent: 19736470 (1999-03-01), None
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patent: 2411249 (2005-08-01), None
patent: 9900689 (1999-01-01), None
patent: 9942885 (1999-08-01), None
PCT International Search Report and Written Opinion for PCT/US2008/082411 from the International Searching Authority, Applicant Cytyc Corporation, Forms PCT/ISA/210, 220 and 237, dated Jan. 29, 2009 (16 pages).
“How to Measure MTF and Other Properties of Lenses”, copyright Optikos Corporation, Cambridge, MA, Jul. 16, 1999, (64 pages).
Corporate Information, Carl Zeiss AG, Web Page, “Foucault's Knife Edge Test,” http://www.zeiss.cz/C12567A100537AB9/Contents-Frame/FD94B02CA79E19BAC12569CF004ABFAD, accessed on Dec. 10, 2007 (1 page).

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