Microscope apparatus control method and microscope apparatus

Image analysis – Image enhancement or restoration – Focus measuring or adjusting

Reexamination Certificate

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Details

C359S391000, C436S172000

Reexamination Certificate

active

07945108

ABSTRACT:
The present invention provides a control method for a microscope apparatus, comprising: a first step for recognizing a type of a specimen retention member retaining a specimen; a second step for obtaining a first image including the whole image of a specimen retention member showing a picture of the entirety of the specimen retention member and an image of the specimen, and obtaining a second image including only the whole image of the specimen retention member in accordance with the type of the specimen retention member; and a third step for obtaining a macro observation image with a self fluorescence removed except for the specimen based on the first image and second image.

REFERENCES:
patent: 6433325 (2002-08-01), Trigg
patent: 6898004 (2005-05-01), Shimizu et al.
patent: 6980293 (2005-12-01), Harada
patent: 7224826 (2007-05-01), Shibazaki et al.
patent: 7277566 (2007-10-01), Miyawaki et al.
patent: 7285787 (2007-10-01), Horigome et al.
patent: 7415144 (2008-08-01), Imaizumi et al.
patent: 7564623 (2009-07-01), Vodyanoy et al.
patent: 7611907 (2009-11-01), Dickson et al.
patent: 7649684 (2010-01-01), Kawasaki et al.
patent: 7867752 (2011-01-01), Greenberger et al.
patent: 2002/0090127 (2002-07-01), Wetzel et al.
patent: 2002/0177149 (2002-11-01), Rimm et al.
patent: 2003/0103662 (2003-06-01), Finkbeiner
patent: 2004/0047033 (2004-03-01), Nakagawa
patent: 2008/0013816 (2008-01-01), Rimm et al.
patent: 11-202213 (1999-07-01), None
patent: 2006-506672 (2006-02-01), None
patent: WO 02/086498 (2002-10-01), None
An Extended European Search Report dated Jul. 24, 2008, issued in a counterpart European Application.

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