Microscope and an observation method in the microscope

Details Microscope and an observation method in the microscope Microscope and an observation method in the microscope

2010-01-29

2011-12-27

Toatley, Gregory J (Department: 2877)

Optics: measuring and testing

For light transmission or absorption

C356S440000

Reexamination Certificate

active

08085402

ABSTRACT:
In a cavity mode of a cavity, a diameter of a mode waist is decreased so that the diameter is similar to a wavelength of an electromagnetic wave resonant with the cavity mode, when a material is located in the cavity. The material includes a physical system having two quantum states. A relative position between the material and the mode waist is scanned along three-directions unparallel mutually. A laser coupled with the cavity mode is input to the cavity. An intensity of at least one of a reflected light and a transmitted light of the laser from the cavity is measured.

REFERENCES:
patent: 2008/0231837 (2008-09-01), Ichimura et al.
“Mechanism and Application of Optical device”, Optronics.co.jp, 2003. (p. 70-73).

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