Microscope

Optical: systems and elements – Compound lens system – Microscope

Reexamination Certificate

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Details

C359S391000

Reexamination Certificate

active

07016108

ABSTRACT:
The invention relates to a microscope, whose support consists of a principal transverse section, a foot section and a column section, which are essentially the same width. A supporting element, is provided on both sides of the column section, said element having the same width along its first contact surface as the column section.

REFERENCES:
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patent: 6304375 (2001-10-01), Furuhashi
patent: 6853481 (2005-02-01), Sukekawa
patent: 2003/0179445 (2003-09-01), Maenie et al.
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patent: 2000-221408 (2000-08-01), None
Carl Zeiss Jena GmbH, “Universalmikroskop Axioplan 2”, Oct. 1995, pp. 1-6, Zeiss Gruppe, Germany, XP-002235323.
Leica, “Systemmikrospkop für Materialuntersuchungen”, Leica DM LM , Mar. 1998, pp. 1-8, Leica Microsystems Wetzler GmbH, Germany, XP-002235324.
Olympus, “Ergonomic Laboratory Microscope BX45/45A” BX2 Series, May 2000, pp. 1-8, XP-002235325.

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