Optical: systems and elements – Compound lens system – Microscope
Reexamination Certificate
2006-09-22
2011-12-20
Nguyen, Thong (Department: 2872)
Optical: systems and elements
Compound lens system
Microscope
C359S368000, C359S558000
Reexamination Certificate
active
08081378
ABSTRACT:
A microscope apparatus can generate information of a super-resolved image at high speed. For that purpose, the microscope apparatus of the present invention is equipped with an image-forming optical system for forming an intermediate image of light emitted from a specimen, a relay optical system for forming an image of the intermediate image, an illuminating optical system that jointly owns an optical path of the image-forming optical system and illuminates the specimen through the optical path of the image-forming optical system, and a spatial modulator disposed on a formation plane of the intermediate image. In this microscope apparatus, the specimen is subjected to structured illumination by an image of the spatial modulator. Light from the specimen which is modulated by the structured illumination is automatically remodulated in the spatial modulator.
REFERENCES:
patent: 4963724 (1990-10-01), Neumann
patent: 5969855 (1999-10-01), Ishiwata et al.
patent: 6020963 (2000-02-01), DiMarzio
patent: 6239909 (2001-05-01), Hayashi et al.
patent: RE38307 (2003-11-01), Gustafsson et al.
patent: 6839166 (2005-01-01), Fukushima et al.
patent: 7075058 (2006-07-01), Chinn et al.
patent: 2006/0147176 (2006-07-01), Takamatsu et al.
patent: A-11-064797 (1999-03-01), None
patent: A-11-242189 (1999-09-01), None
patent: A-2002-311335 (2002-10-01), None
patent: A-2003-262798 (2003-09-01), None
W. Lukosz, “Optical Systems with Resolving Powers Exceeding the Classical Limit. II,”Journal of the Optical Society Of America, vol. 57, No. 7, Jul. 1967, pp. 932-941.
W. Lukosz et al., “Optischen Abbildung unter Überschreitung der beugungsbedingten Auflösungsgrenze,”Opt. Acta., vol. 10, 1963, p. 241-255.
Ooki Hiroshi
Osawa Hisao
Ouchi Yumiko
Yonezawa Yasuo
Nguyen Thong
Nikon Corporation
Oliff & Berridg,e PLC
LandOfFree
Microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4301641