Microreflectometer system

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250572, 356237, 356445, 356447, G01B 900, G01N 2100, G01N 2155

Patent

active

052932117

ABSTRACT:
The microreflectometer system, forming a 0.01 mm.sup.2 area spot, scans a mirror coating for defects of a mirror having a diameter of about 30 centimeters. Tens of thousands of reflectivity measurements are automatically taken as a computer controlled three dimension stage having the test mirror therein is selectively controlled. The reflectivity of each measurement either relative or absolute is used to determine the condition of the coating.

REFERENCES:
patent: 2451501 (1948-10-01), Liben
patent: 3336833 (1967-08-01), Villers
patent: 3892494 (1975-07-01), Baker et al.
patent: 3994586 (1976-11-01), Sharkins et al.
patent: 4073590 (1978-02-01), Brown
patent: 4097751 (1978-06-01), Egan et al.
patent: 4289400 (1981-09-01), Kubota et al.
patent: 4441124 (1984-04-01), Heebner et al.
patent: 4508450 (1985-04-01), Ohshima et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Microreflectometer system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Microreflectometer system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microreflectometer system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-156816

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.