Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
Reexamination Certificate
2011-06-14
2011-06-14
Hiltunen, Thomas J (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
With specific source of supply or bias voltage
C327S534000
Reexamination Certificate
active
07961034
ABSTRACT:
A method for compensating negative bias temperature instability (NBTI) effects on a given model of transistors includes monitoring the NBTI effects on the transistors over time, determining a change in a threshold voltage of the transistors over time based on the monitoring, determining a forward bias voltage based on the change in threshold voltage, and applying the forward bias voltage to the transistors over time. The method may further include storing the monitoring results in a lookup table, and adjusting the forward bias voltage based on the lookup table. The monitoring may include emulating the NBTI effects on a system comprising a plurality of semiconductor devices in which the transistors are used.
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Hiltunen Thomas J
Oracle America Inc.
Osha • Liang LLP
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