Microprocessor controlled system for testing and selectively rec

Details Microprocessor controlled system for testing and selectively rec Microprocessor controlled system for testing and selectively rec

1992-10-15

1993-11-09

Ramsey, Kenneth J.

Electric lamp or space discharge component or device manufacturi

Apparatus

Repairing, converting or salvaging means

445 2, H01J 942

Patent

active

052598004

ABSTRACT:
A microprocessor controlled system for testing and selectively reconditioning a CRT in accordance with the Beltron process. The microprocessor monitors the function and filament voltage selection switches actuated by an operator. Once the filament voltage and functions have been specified, the microprocessor automatically controls the application of filament voltage, AC voltage and relatively high DC voltage to the CRT and displays the progress and results of the selected function. The system tests the emission characteristics of the cathode in each gun element, causes simultaneous cleaning of the cathode/grid elements by controlling the application of an AC voltage across each cathode/grid circuit while the filament voltage is at an elevated level, and restores those cathode/grid circuits requiring restoration by controlling the application of a relatively high DC voltage to each cathode/grid circuit in serial fashion for the several gun elements while maintaining the filament voltage at an elevated level. The system substantially reduces required operator interaction with the testing and reconditioning procedure and provides a commensurate reduction in the probability of destruction of a CRT by operator error.

REFERENCES:
patent: 2897435 (1959-07-01), Fistell
patent: 3641391 (1972-02-01), Badewitz
patent: 3915533 (1975-10-01), Kozicki
patent: 3977745 (1976-08-01), DiCecco et al.
patent: 3997223 (1976-12-01), Feldman
patent: 4066311 (1978-01-01), Poulson

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