Microprobe, preparation thereof and electronic device by use of

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor

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117 94, 117 95, 117 97, 117913, 117923, C30B 2504

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active

054820022

ABSTRACT:
A microprobe is provided which comprises a single crystal provided on a part of one main surface of a substrate or a part of a thin film formed on one main surface of the substrate. The microprobe may have a single crystal having an apex portion surrounded by facets having a specific plane direction and comprising a specific crystal face. The method for preparing the microprobe and an electronic device employing the microprobe also provided which is useful for recording and reproducing.

REFERENCES:
patent: 4343993 (1982-08-01), Binnig et al.
patent: 4575822 (1986-11-01), Quate
patent: 4592792 (1986-06-01), Corboy et al.
patent: 4637127 (1987-01-01), Kurogi et al.
patent: 5236546 (1993-08-01), Mizutani
patent: 5273616 (1993-12-01), Bozler
Biegelsen et al., "Ion Milled Tips for Scanning Tunneling Microscopy", Applied Physics Letters, vol. 50, No. 11, Mar. 16, 1987, pp. 696-698.
Fink, "Mono-Atomic Tips for Scanning Tunneling Microscopy", IBM Journal of Research & Development, vol. 30, No. 5, Sep. 1986, pp. 460-465.
Patent Abstracts of Japan, 87 P 672, Kokai 62-209302 (Ishida), Sep. 14, 1987.
Binnig et al., "Scanning Tunneling Microscopy", Helvetica Acta Physica, vol. 55, 1982, pp. 726-735.

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