Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern
Reexamination Certificate
2006-03-07
2006-03-07
Sample, David (Department: 1755)
Chemistry of inorganic compounds
Zeolite
Structure defined x-ray diffraction pattern
C423S706000, C423S708000, C423S329100
Reexamination Certificate
active
07008611
ABSTRACT:
The invention relates to a microporous crystalline zeolite material having the empirical formulain-line-formulae description="In-line Formulae" end="lead"?x(M1
XO2):yYO2:(1−y)SiO2in-line-formulae description="In-line Formulae" end="tail"?wherein x has a value less than 0.02; y has a value less than 0.1; M is at least an inorganic cation with a +n charge; X is at least a chemical element having oxidation state +3, preferably selected from the group consisting of Al, Ga, B, Cr, Fe, and Y is at least a chemical element with oxidation state +4, preferably selected from the group consisting of Ge, Ti, Sn, V. The inventive material can be obtained by means of a process comprising: preparing a laminar precursor, crystallized from a reaction mixture; swelling the precursor in a solution in order to obtain a swollen laminar material; which is then washed and dried to obtain a swollen solid; delaminating the solid to obtain a delaminated material in suspension; separating the delaminating material and eliminating the organic remnants by cationic exchange and/or calcination.
REFERENCES:
patent: 4954325 (1990-09-01), Rubin et al.
patent: 5278115 (1994-01-01), Kresge et al.
patent: 5284643 (1994-02-01), Morrison et al.
Canós Avelino Corma
Díaz Morales Urbano
Fornes Segui Vicente
Consejo Superior de Investigaciones Cientificas
Klauber & Jackson
Sample David
Universidad Politecnica de Valencia
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