Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1994-06-28
1996-03-26
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With polariscopes
356369, G01J 400
Patent
active
055025676
ABSTRACT:
A micropolarimeter comprises an analyzer (1) and a detector (3), which is typically a photodetector array. The detector has a circular configuration of a number N of sectors. Analyzer (1) and detector (3) form a unit with the analyzer assigning different polarization values to the sectors. Analyzer and the detector contain no moving parts. Three different embodiments are proposed for the analyzer: a glass cone, covered with a polarizing thin film stack, a metal grid polarizing array, and an array of polarizing waveguides. The micropolarimeter (14) is used preferably in a microellipsometer system which can serve as a tool for film diagnostics, especially optical characterization of thin films.
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Abraham Michael
Ehrfeld Wolfgang
Kiefer Eckehard
Pokrowsky Peter
Stenkamp Bernd
International Business Machines - Corporation
Pham Hoa Q.
Saber Paik
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