Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2006-10-17
2006-10-17
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
Reexamination Certificate
active
07123361
ABSTRACT:
A microplasma emission spectrometer is described that includes a chamber for confining a sample volume of gas. A microplasma source that includes a resonant antenna structure generates a microplasma in the chamber from the sample volume of gas. A RF power supply provides power to the resonant antenna structure that generates the microplasma from the sample volume of gas. A spectrally sensitive detector is optically coupled to the microplasma. The entrance of the spectrally sensitive detector has dimensions and is positioned so that emissions from at least one-tenth of a total volume of the microplasma are transmitted through the entrance of the spectrally sensitive detector.
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Geisel Kara
Rauschenbach Kurt
Rauschenbach Patent Law Group, LLC
Toatley , Jr. Gregory J.
Verionix Incorporated
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