Micrometer adjustable backgauge

Geometrical instruments – Area integrators – Electrical

Patent

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Details

33170, 72 36, G01B 502, B21D 1122

Patent

active

044208901

ABSTRACT:
A backgauge locator which provides manual adjustment of the backgauge relative to the die elements of a machine tool press brake. When used in pairs, each probe tip is contiguous with the outer edge of the workpiece to prevent parallel misalignment. The body is slideably attached to the machine tool backgauge to compensate for varying widths of the workpiece having an over-center spring loaded cam for manual positioning. A probe is pivotally located in the body and spring loaded to engage a micrometer head providing controlled linear movement. The probe pivots upward to allow for secondary bends of the workpiece without damaging the precision micrometer head and the tension spring also acts as a return mechanism to reposition the probe when the workpiece is removed.

REFERENCES:
patent: 2924260 (1960-02-01), Guarino
patent: 3217416 (1965-11-01), Bachert et al.
patent: 3666227 (1972-05-01), Frederick
patent: 3704611 (1972-12-01), Hirsch
patent: 3812695 (1974-05-01), Roch
patent: 3826119 (1974-07-01), Marotto
patent: 4137643 (1979-02-01), Carmel
patent: 4139948 (1979-02-01), Tsuchiya et al.

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