Micrographic detection of plastic deformation in nickel base all

Details Micrographic detection of plastic deformation in nickel base all Micrographic detection of plastic deformation in nickel base all

1980-09-29

1984-05-01

Tung, T.

Chemistry: electrical and wave energy

Processes and products

Electrostatic field or electrical discharge

204 1T, 204401, 356 32, C25D 538, G01N 2761

Patent

active

044459882

ABSTRACT:
A method for detecting low levels of plastic deformation in metal articles comprising electrolytically etching a flow free surface of the metal article with nital at a current density of less than about 0.1 amp/cm.sup.2 and microscopically examining the etched surface to determine the presence of alternating striations. The presence of striations indicates plastic deformation in the article.

REFERENCES:
D. A. Trotsenko et al., Patent Associated Literature #I163-7510-H, Detect of Fatigue Cracks, Jul. 1975.
M. F. Berezhnitskaya et al., Patent Associated Literature #S134-7602-I, Method of Determining the Residual Macrostress in Solid & Hollow Cylindrical Rods, Sep. 1975.
Spurling et al., Journal of Nuclear Materials 44, No. 3 (Sep.) 1972, 341-344 North-Holland Publishing Co, Amsterdam.
Smirnova et al., Patent Associated Literature, #I163-7602-Y Method of Revealing the Deformation Microvoids and Macrostructure of Nickel-Basic Heat-Resistant Alloys, Nov. 1975.

Affiliated with

Also associated with

Rating

Micrographic detection of plastic deformation in nickel base all does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Micrographic detection of plastic deformation in nickel base all, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Micrographic detection of plastic deformation in nickel base all will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2030268