Microfinish measurement apparatus and technique

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

73105, H04N 718

Patent

active

044764898

ABSTRACT:
An apparatus and technique for measuring microfinishes of workpieces at on-line speeds. A digitized image of a finished surface of a workpiece is generated. Under microprocessor control, a distribution of the digitized values is obtained. This distribution is compared against pre-stored distributions of known surface finishes to determine the type of finish of the workpiece and/or the acceptability of the finish. The comparison is obtained using curve matching techniques and by comparison of mean gray level values.

REFERENCES:
patent: 3133149 (1964-05-01), Inaba
patent: 3320799 (1967-05-01), Goody
patent: 3372578 (1968-03-01), Harmon
patent: 3377828 (1968-04-01), Harmon
patent: 3688569 (1972-09-01), Murdoch
patent: 3733598 (1973-05-01), Kato
patent: 3855843 (1974-12-01), Yagiela
patent: 4106333 (1978-08-01), Salje
patent: 4126036 (1978-11-01), Nilan
patent: 4148027 (1979-04-01), Nowogrodzki
patent: 4149187 (1979-04-01), Palmer

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Microfinish measurement apparatus and technique does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Microfinish measurement apparatus and technique, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microfinish measurement apparatus and technique will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1604030

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.