Measuring and testing – Probe or probe mounting
Patent
1988-01-29
1991-06-04
Noland, Tom
Measuring and testing
Probe or probe mounting
73DIG4, 29595, 156647, 156662, G01R 300, H01L 21306
Patent
active
050203762
ABSTRACT:
A method of making a microenvironmental sensor for neurological use in which the sensor is formed on a silicon wafer by the use of known integrated circuit techniques. A mask is applied to define the outline of the sensor, trenches are etched surrounding the sensor by the use of an anisotropic etchant and the sensor is separated by etching surplus silicon from the rear surface of the wafer.
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Ensell Graham
Leong David
Pickard Robert S.
Wall Peter
Noland Tom
University College Cardiff Consultants Limited
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