Microelectronic structure with a high germanium...

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Reexamination Certificate

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C257S458000, C257SE33046, C257SE33049

Reexamination Certificate

active

11035628

ABSTRACT:
A method of forming a high germanium concentration, low defect density silicon germanium film and its associated structures is described, comprising forming a dielectric layer on a substrate, patterning the dielectric layer to form a silicon region and at least one dielectric region, and forming a low defect silicon germanium layer on at least one dielectric region.

REFERENCES:
patent: 5525828 (1996-06-01), Bassous et al.
patent: 5659187 (1997-08-01), Legoues et al.
patent: 6784466 (2004-08-01), Chu et al.
patent: 2003/0203531 (2003-10-01), Schukin et al.
patent: 2004/0121507 (2004-06-01), Bude et al.
Zytkiewicz: Laterally Overgrown Structures as Substrates for Lattice Mismatched Epitaxy; Thin Solid Films 412 (2002); pp. 64-75.

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