Microelectronic burn-in system

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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219209, 324 73PC, G01R 104, G01R 3102

Patent

active

047774347

ABSTRACT:
An apparatus for use in thermally testing electrical components, especially microelectronic components, such as dual in-line integrated circuit packages is disclosed. The apparatus is for use in testing the electrical performance of components when subjected to elevated temperature. Heat is applied through resistive heating elements disposed adjacent the electrical components which are mounted in electrical connectors, such as DIP sockets. Separate test and heater printed circuit boards attachable to conventional edge connectors can be employed. Insulation completely surrounds the sockets and the electrical components. Heating elements having a ferromagnetic-nonferromagnetic layer construction and exhibiting constant temperature regulation at a characteristic Curie point can be employed.

REFERENCES:
patent: 3584189 (1971-06-01), Marcoux
patent: 4256945 (1981-03-01), Carter et al.
patent: 4374317 (1983-02-01), Bradshaw
patent: 4400613 (1983-08-01), Popelish
patent: 4553020 (1985-11-01), Val
patent: 4568277 (1986-02-01), MacInnes et al.
patent: 4607220 (1986-08-01), Hollmann
patent: 4683424 (1987-07-01), Cutright et al.
patent: 4695707 (1987-09-01), Young
"Improved Design of an Electrical Component Test System", by Alewine et al, IBM Tech. Disc., Aug. '83, vol. 26, #3B, p. 1464.
Electronic Packaging & Production (pp. 16, 18).
Electronic Engineering Times (12-2-85).
Electronic Design (11-14-85).

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