Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Patent
1998-02-27
2000-01-04
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
702 38, 702 94, 324235, 3242072, 3242076, 338 32R, 338 32H, G01B 730
Patent
active
060120215
ABSTRACT:
A microelectric position sensor wherein an assembly of magnetic field sensitive elements assume first and second states when subjected to a magnetic field having an intensity below or above first or second predetermined values respectively. A magnet is selectively movable relative to the assembly, so that the elements are selectively subjected to the magnetic field. The magnet has focusing tongues for focusing the magnetic field at a region including substantially only one of the elements, so that the magnetic field within the region has an intensity above the second value, and the magnetic field outside the region has an intensity below the first value.
REFERENCES:
patent: 3139600 (1964-06-01), Rasmanis et al.
Rombach Pirmin
Stenberg Lars J.
Hoff Marc S.
Microtronic A/S
Vo Hien
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