Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-06-05
2008-12-02
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010
Reexamination Certificate
active
07459922
ABSTRACT:
A microcontactor probe has an insulator (6, 7) formed with a support hole (8, 9) having an open end and a close end, a lead conductor (11) exposed inside the support hole (8, 9) at the close end, and a resilient conductive assembly (2, 3, 4) fitted in the support hole (8, 9) and kept from falling. The resilient conductive assembly (2, 3, 4) includes a first plunger (3) exposed outside at the open end, a second plunger (4) contacting the lead conductor (11), a tubular conductor portion (15b) on one (4) of the first and second plungers (3, 4), a stem part (3a) of the other one of the first and second plungers, at least a portion of the stem part establishing a substantially concentric relationship with the tubular conductor portion (15b) at least during a probe operation, the concentric relationship of the tubular conductor portion (15b) with the stem part (3a) minimizing resistance and induction during a probe operation, and a coil spring fitted on the first and second plungers, the coil spring (2) having a connected tight wound portion (15a) fixed to said one (4) of the first and second plungers (3, 4) at a fixed part (P) for conduction, the tight wound portion (15a) slidably contacting said other (4) of the first and second plungers (3, 4), whereby the tight wound portion (15a) minimizes resistance and induction during a probe operation.
REFERENCES:
patent: 4528500 (1985-07-01), Lightbody et al.
patent: 5157325 (1992-10-01), Murphy
patent: 5576631 (1996-11-01), Stowers et al.
patent: 5990697 (1999-11-01), Kazama
patent: 6043666 (2000-03-01), Kazama
patent: 6323667 (2001-11-01), Kazama
patent: 6396293 (2002-05-01), Vinther et al.
patent: 6462567 (2002-10-01), Vinther et al.
patent: 0811287.0 (2004-03-01), None
patent: 88 12 068 (1989-02-01), None
patent: 0621 485 (1994-10-01), None
patent: 10-239349 (1998-09-01), None
patent: 10239349 (1998-09-01), None
patent: 98 29751 (1998-07-01), None
patent: 01 37381 (2001-05-01), None
patent: WO-02/04961 (2002-01-01), None
Chung Sung Y.
Meyer Jerald L.
Nath Law Group
Nguyen Vinh P
NHK Spring Co. Ltd.
LandOfFree
Microcontactor probe assembly having a plunger and electric... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Microcontactor probe assembly having a plunger and electric..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Microcontactor probe assembly having a plunger and electric... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4035819