Microanalysis particle sampler

Details Microanalysis particle sampler Microanalysis particle sampler

1984-11-05

1986-05-27

Kreitman, Stephen A.

Measuring and testing

Gas analysis

Solid content of gas

2504401, G01N 1502

Patent

active

045907927

ABSTRACT:
Apparatus of the invention enables gas entrained particulate collection and transfer of collected particulate into position for scanning by a scanning electron microscope; and it comprises:

REFERENCES:
patent: 3224434 (1965-12-01), Molomut et al.
patent: 3972226 (1976-08-01), Rountree et al.
patent: 3983743 (1976-10-01), Olin et al.
patent: 4301371 (1981-11-01), Lieb
C. J. Peat, "A Modified Specimen Stub for the Scanning Electron Microscope", Journal of Microscopy, vol. 101 Pt. 3, pp. 323-327, Aug. 1974.

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