Micro thermal chamber having proximity control temperature...

Details Micro thermal chamber having proximity control temperature... Micro thermal chamber having proximity control temperature...

2007-12-04

2007-12-04

Paschall, Mark (Department: 3742)

Electric heating

Metal heating

By arc

C219S121540, C219S121400, C156S345270, C156S345520, C118S725000

Reexamination Certificate

active

10822841

ABSTRACT:
A temperature unit to control a temperature of a device under test using a fluid includes a block disposed opposite the device under test and which defines a gap therebetween and through which the fluid passes across the device under test at a gap flow rate, and an actuator which moves the block. By adjusting the gap, the gap flow rate of the fluid flowing over the device under test changes so as to adjust the temperature of the device under test. Additionally, the block can be a heater block which generates heat receivable by the device under test across the gap such that the adjustment of the heater block by the actuator changes a thermal resistance across the gap.

REFERENCES:
patent: 5821505 (1998-10-01), Tustaniwskyj et al.
patent: 5844208 (1998-12-01), Tustaniwskyj et al.
patent: 5966940 (1999-10-01), Gower et al.
patent: 6002109 (1999-12-01), Johnsgard et al.
patent: 6091062 (2000-07-01), Pfahnl et al.
patent: 6215106 (2001-04-01), Boas et al.
patent: 6307388 (2001-10-01), Friedrich et al.
patent: 6893505 (2005-05-01), Peace
patent: 2001/0019899 (2001-09-01), Rolfson et al.
patent: 2004/0051545 (2004-03-01), Tilton et al.
patent: 2004/0060917 (2004-04-01), Liu et al.
http://www.aetrium.com/mdtx32.htm;Model DTX Series Dynamic Temperature Pick-And-Place IC Test Handler,pp. 1-4.
http://www.deltad.com/products/autotest/pickplace—summit.htm;Delta Design Products: Automated Test Handlers: Pick&Place Summit Handler.
http://www.testandmeasurement.com/Content/ProductShowcase/product.asp?DOCID;Test and Measurement.Com, Schlumberger introduces IHS 1100 test handler with advanced thermal control; pp. 1 & 2.
PCT Written Opinion of the International Searching Authority dated Jul. 28, 2005 issued in corresponding PCT Application No. PCT/JP2005/007491.
PCT International Search Report dated Jul. 28, 2005 issued in corresponding PCT Application No. PCT/JP2005007491.

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