Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-06-26
2007-06-26
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S112000, C702S124000, C324S076120
Reexamination Certificate
active
11442978
ABSTRACT:
A micro-magnetization analysis program, method, and apparatus which can analyze transitional change of a micro-magnetization state while one of a plurality of magnetic substances such as a recording medium and a recording head is moved in an arbitrary direction. An input unit reads an analysis object model in which merely regions of a magnetic substance fixed in a space and a magnetic substance to be moved are subjected to mesh-division into minute elements and analysis conditions. A magnetic field distribution calculating unit generates a first magnetic field equation, generates a second magnetic field equation, and solves the simultaneous equations thereof.
REFERENCES:
patent: 06-006502 (1994-01-01), None
patent: 11-296504 (1999-10-01), None
patent: 2003-030805 (2003-01-01), None
Fujitsu Limited
Kundu Sujoy
Nghiem Michael
Staas & Halsey , LLP
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