Micro-magnetization analysis program, method, and apparatus

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Details

C702S112000, C702S124000, C324S076120

Reexamination Certificate

active

11442978

ABSTRACT:
A micro-magnetization analysis program, method, and apparatus which can analyze transitional change of a micro-magnetization state while one of a plurality of magnetic substances such as a recording medium and a recording head is moved in an arbitrary direction. An input unit reads an analysis object model in which merely regions of a magnetic substance fixed in a space and a magnetic substance to be moved are subjected to mesh-division into minute elements and analysis conditions. A magnetic field distribution calculating unit generates a first magnetic field equation, generates a second magnetic field equation, and solves the simultaneous equations thereof.

REFERENCES:
patent: 06-006502 (1994-01-01), None
patent: 11-296504 (1999-10-01), None
patent: 2003-030805 (2003-01-01), None

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