Etching a substrate: processes – Gas phase and nongaseous phase etching on the same substrate
Patent
1995-06-09
1996-10-22
Breneman, R. Bruce
Etching a substrate: processes
Gas phase and nongaseous phase etching on the same substrate
216 76, 216 79, 216101, 1566511, H01L 21027
Patent
active
055673325
ABSTRACT:
A gaseous process for removing and vaporizing at least a portion of a silicon oxide film from between a substrate and a superstructure leaving a space between the substrate and the superstructure. The silicon oxide layer is removed in two steps. In the first step the bulk of the silicon oxide layer is removed by a rapid liquid or gaseous etching process, leaving at least a portion of the silicon oxide layer directly underlying the superstructure in place so as to support the superstructure during a wash cycle. In the second silicon oxide removal step the substrate is introduced to a high flow rate gaseous environment containing a relatively high concentration of anhydrous HF to which no, or only a relatively very low amount of, additional water vapor is provided until the silicon oxide directly underlying the superstructure has been removed.
REFERENCES:
patent: 4372803 (1983-02-01), Gigante
patent: 4749440 (1988-06-01), Blackwood et al.
patent: 5043043 (1991-08-01), Howe et al.
patent: 5089084 (1992-02-01), Chhabra et al.
patent: 5093594 (1992-03-01), Mehregany
patent: 5177661 (1993-01-01), Zavracky et al.
patent: 5294568 (1994-03-01), McNeilly et al.
Wong et al, "Wafer Temperature Dependence of the Vapor-Phase HF Oxide Etch", J. Electrochem. Soc., 140, 205-208 (Jan. 1993).
Ruzyllo, et al, "Etching of Thermal Oxides in Low Pressure Anhydrous HF/CH.sub.2 OH Gas Mixture at Elevated Temperature", J. Electrochemical Soc. 140, L64-L66 (Apr. 1993).
Miki et al, "Vapor-Liquid Equilibrium of the Binary System HF-H.sub.2 O extending to Extremely Anhydrous Hydrogen Fluoride", J. Electrochem. Soc. 137, 787-790 9 (Mar. 1990).
Wong, et al, "Characterization of Wafer Cleaning and Oxide Etching Using Vapor-Phase Hydrogen Fluoride", J. Electrochem. Soc., 138, 1799-1802 (Jun. 1991).
Werkhoven, et al, "Contamination Control of Polysilicon Gates in a Vertical Reactor Cluster Tool," Journal of the IES, May/Jun. 1993, pp. 33-36.
Hendriks, et al, "Poly-gate Structures Manufactured in a Cluster Tool," Applied Surface Science, 70/71. (1993), 619-623.
Wantanabe, et al, "A New Cylindrical Capacitor Using Hemispherical Grained Si (HSG-Si) for 256Mb DRAMs",IEDM Technical Digest, 10.1.1-10.1.4 (Dec. 1992).
Helms, et al, "Mechanisms of the HF/H.sub.2 O Vapor Etching of SiO.sub.2 ",J. Vac. Sci. Technol. A, 10, 806-811 (Jul./Aug. 1992).
Galewski, et al, "Silicon Water Preparation for Low-Temperature Selective Epitaxial Growth," IEEE Translations on Semiconductor Manufacturing, 93-98 (Aug. 1990).
Werknoven, et al, "Cluster-Tool Integrated HF Vapor Etching for Native Oxide Free Processing", Mat. Res. Soc. Proc., 315, pp. 211-217 (1993).
Martin, et al, "LPVCD Si.sub.3 N.sub.4 growth retardation on silicon native oxide compared with in situ HF vapour-deglazed silicon substrates", Semicond. Sci. Technol. 6 (1991) 1100-1102.
N. Miki, et al, " Selective Etching of Native Oxide By Dry Processing Using Ultra Clean Anhydrous Hydrogen Fluoride", Hashimoto Chem. Ind. Co. Ltd, pp. 730-733 (1988).
A. Philipossian, "The Activity of HF/H.sub.2 O Treated Silicon Surfaces in Ambient Air Before and After Gate Oxidation", J. Electrochem. Soc. vol 139, No. 10, pp. 2956-2961, (Oct. 1992).
N. Miki, et al, "Gas-Phase Selective Etching of Native Oxide", Transactions on Electron Devices, vol. 37, No. 1, pp. 107-115, (Jan. 1990).
Breneman R. Bruce
FSI International
Goudreau George
LandOfFree
Micro-machine manufacturing process does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Micro-machine manufacturing process, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Micro-machine manufacturing process will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2356012