Micro-imaging system

Details Micro-imaging system Micro-imaging system

1996-09-19

1998-05-19

Font, Frank G.

Optics: measuring and testing

By particle light scattering

With photocell detection

356338, 356344, 356318, G01N 2100

Patent

active

057542910

ABSTRACT:
The present invention features two flat-field, telecentric, infinite conjugate, achromatic objectives each of which has an external pupil lying in a common plane located equidistant from the two objectives, defining a mechanically accessible central pupil of an imaging system centered in the common plane. Each of the objectives are afocal in the common plane, with one of the lenses forming a focal plane proximate to a sample. The lenses are adapted to provide varying levels of magnification while keeping constant the number of resolvable points in the field of view. An array detector is positioned proximate to a focal plane formed of the remaining objective lens. The double objective lens assembly is described as being included in transillumination and epi-illumination systems.

REFERENCES:
patent: 1777262 (1930-09-01), Hasselkus et al.
patent: 4680635 (1987-07-01), Khurana
patent: 4755874 (1988-07-01), Esrig et al.
patent: 5034613 (1991-07-01), Denk
patent: 5141609 (1992-08-01), Sweedler et al.
patent: 5294323 (1994-03-01), Togusari et al.
patent: 5296700 (1994-03-01), Kumagai
patent: 5500770 (1996-03-01), Zinter et al.

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