Micro-controller with a built-in test circuit and method for tes

Details Micro-controller with a built-in test circuit and method for tes Micro-controller with a built-in test circuit and method for tes

1995-11-17

1998-09-01

Nguyen, Hoa T.

Excavating

371 225, 371 211, 39518306, G01R 3128, G11C 2900, G06F 1100

Patent

active

058020713

ABSTRACT:
An improved micro-controller with a built-in test circuit is disclosed. It contains: (a) a test-mode switching register for receiving an external instruction from a test instrument so to select a test mode and to switch the external instruction to a predetermined circuit according to a selected test mode; (b) a test control circuit electrically connected to the test-mode switching register for controlling a timing of the external instruction received from the test instrument; (c) a multiplexer electrically connected to the test control circuit to receive an output signal from the test control circuit; (d) a control circuit electrically connected to the multiplexer for receiving an output signal therefrom, wherein the control circuit decodes and executes the output signal from the multiplexer, and sends an executing result to the test instrument; (e) a test program memory electrically connected to the multiplexer for storing a built-in test program, so as to allow the micro-controller to be tested in an internal mode; (f) an application program memory for storing an application program; and (g) a ROM read-out device electrically connected to the multiplexer and the application program memory for reading program codes from the application program memory to facilitate the test instrument to make a comparison.

REFERENCES:
patent: 4520440 (1985-05-01), Buonomo et al.
patent: 4672534 (1987-06-01), Kaniya
patent: 4839852 (1989-06-01), Knutsen
patent: 5073891 (1991-12-01), Patel
patent: 5214695 (1993-05-01), Arnold et al.
patent: 5379342 (1995-01-01), Arnold et al.

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