Micro-circuit test probe

Details Micro-circuit test probe Micro-circuit test probe

1975-05-08

1977-07-05

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106, G01R 3102

Patent

active

040342930

ABSTRACT:
A probe for testing integrated circuit components which includes a dielectric support body, conductive arms supported by the body and with the arms including a longer arm and a shorter arm. The shorter arm is positioned above the longer arm in spaced relation thereto with each arm having an outer end connected to a conductive probe tip. The probe tip includes a downwardly positioned point for contact with a surface having an integrated circuit defined thereon and contact means are provided which cooperate with the arms and tip to transmit an electrical signal to the tip or receive a signal from the tip.

REFERENCES:
patent: 3551807 (1970-12-01), Kulischenko et al.
patent: 3648169 (1972-03-01), Wiesler

Affiliated with

Also associated with

Rating

Micro-circuit test probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Micro-circuit test probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Micro-circuit test probe will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-580142