Micro-circuit test probe

Details Micro-circuit test probe Micro-circuit test probe

1974-10-11

1977-01-04

Segal, Robert

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106, G01R 3102

Patent

active

040016854

ABSTRACT:
A probe for testing integrated circuit components which includes a dielectric support body, conductive arms supported by the body and with the arms including a longer arm and a shorter arm. The shorter arm is positioned above the longer arm in spaced relation thereto with each arm having an outer end connected to a conductive probe tip. The probe tip includes a downwardly positioned point for contact with a surface having an integrated circuit defined thereon and contact means are provided which cooperate with the arms and tip to transmit an electrical signal to the tip or receive a signal from the tip. The probe tip includes a thin-walled bent tube that is secured to the probe. The bend in the thin-walled tube serves to frictionally hold a needle in the thin-walled tube because on insertion of a needle the tube will be resiliently straightened to create a frictional force between the tube and the needle.

REFERENCES:
patent: 3437929 (1969-04-01), Glenn
patent: 3731191 (1973-05-01), Bullard et al.

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