Metrology system for precision 3D motion

Details Metrology system for precision 3D motion Metrology system for precision 3D motion

2005-04-05

2005-04-05

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

For dimensional measurement

C356S486000, C356S492000, C356S493000

Reexamination Certificate

active

06876453

ABSTRACT:
The instant invention is a method and apparatus for the measurement, with low uncertainty, of the six degrees of freedom of a first structure relative to a second structure. The apparatus is comprised of compact, rigid, thermally stable structures. The invention uses linear displacement transducers which have no active pointing to maintain a desired orientation of the linear displacement transducers with other parts of the measurement system.

REFERENCES:
patent: 3601490 (1971-08-01), Erickson
patent: 3822942 (1974-07-01), Hock
patent: 5402981 (1995-04-01), McMurtry et al.
patent: 5681981 (1997-10-01), McMurtry
patent: 5940180 (1999-08-01), Ostby
Evans, C.J., “Precision Engineering; an Evolutionary View”, Cranfield Press, 1989; see Chapter 3, p. 43 for a brief discussion of the history of metrology frames.
Tutton, A.E.H., “A wavelength comparator for standards of length” Phil. Trans Roy. Soc, vol. 210 (1910) p. 1.
Donaldson, R.R., “Error budgets”, Technology of Machine Tools, vol. 5: Machine tool accuracy UCRL-52960-5 (1980).
Slocum, A., “Precision Machine Design”, Prentice Hall, 1992, Chapter 5.7 (Metrology frames′).
Evans, C.J., “Precision Engineering: an Evolutionary View”, Cranfield Press, 1989; Chapter 3, p. 43 (see brief discussion of metrology frames).
Bryan, J.B., “Design and construction of an 84 inch diamond turning machine”, Precision Engineering, vol. 1, No. 1, p. 13.
Ruijl, T., “Ultraprecision Coordinate measuring machine”, PhD Thesis, University of Delft, 2001.
Ruijl, T., et al., “Ultra-precision CMM Aiming for the Ultimate Concept”, Proc. EUSPEN, Torino, May 2001.
Peggs, G.N. et al., “Design of a Compact High Accuracy CMM”, CIRPAnnals, vol. 48/1 (1999), p. 417.

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