Metrology system for analyzing panel misregistration in a panel

Details Metrology system for analyzing panel misregistration in a panel Metrology system for analyzing panel misregistration in a panel

1990-08-31

1993-04-27

Cosimano, Edward R.

Boots, shoes, and leggings

382 8, G01B 1126

Patent

active

052068200

ABSTRACT:
A metrology system to analyze panel misregistration in a panel manufacturing process includes a software controlled system which checks defined panel parameters on the four corners of a panel and related artwork for processing with a master pattern etched on a glass reference with a machine vision measuring system. The panel or artwork being checked is positioned by panel center registration means to align the center of the panel with the center of the master pattern. Displacement and rotational differences are entered under software control into a data base and analyzed by a stored program intelligent analyses system into a plurality of parameters based on a parameter model which permits an analysis of the cause of the misregistration.

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"Surface-Mounted Device Placement" IBM Technical Disclosure Bulletin; vol. 30, No. 1; Jun. 1987; pp. 228-334.

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