Semiconductor device manufacturing: process – Having organic semiconductive component
Reexamination Certificate
2007-12-11
2007-12-11
Geyer, Scott B. (Department: 2812)
Semiconductor device manufacturing: process
Having organic semiconductive component
C257SE21242
Reexamination Certificate
active
11187552
ABSTRACT:
A method is disclosed for making a metal electrode which minimizes the contact resistance between it and an organic semiconductor. Acid-stabilized metal nanoparticles are deposited upon a substrate and annealed. This creates a metal electrode and releases acid. Upon deposition of semiconductor and subsequent annealing, the acid diffuses from the electrode into the semiconductor layer and acts as a dopant, minimizing the contact resistance. The use of oleic acid-stabilized silver nanoparticles is demonstrated.
REFERENCES:
patent: 2003/0160230 (2003-08-01), Ong et al.
Li Yuning
Ong Beng S.
Wu Yiliang
Fay Sharpe LLP
Palazzo Eugene O.
Xerox Corporation
LandOfFree
Methods to minimize contact resistance does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods to minimize contact resistance, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods to minimize contact resistance will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3866370