Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2005-12-06
2005-12-06
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C257S647000
Reexamination Certificate
active
06972242
ABSTRACT:
Semiconductor device fabrication methods are disclosed. According to one example, a method includes forming a pad oxide layer and a nitride layer sequentially on a silicon substrate, and forming a photoresist pattern for trench formation on the nitride layer; etching the nitride layer and the pad oxide layer using the photoresist pattern as a mask while etching the silicon substrate to form a trench using the nitride layer as an etch stopper; filling the trench by depositing an oxide layer for trench gap filling on entire surface of the silicon substrate; and performing planarization which makes the gap filling oxide exist only in the trench.
REFERENCES:
patent: 5721173 (1998-02-01), Yano et al.
patent: 5976951 (1999-11-01), Huang et al.
patent: 5994201 (1999-11-01), Lee
patent: 6074927 (2000-06-01), Kepler et al.
patent: 6180490 (2001-01-01), Vassiliev et al.
patent: 6524931 (2003-02-01), Perera
patent: 6573551 (2003-06-01), Kim et al.
patent: 6744097 (2004-06-01), Yoo
patent: 6833311 (2004-12-01), Ho et al.
patent: 2004/0183121 (2004-09-01), Yeh et al.
DongbuAnam Semiconductor, Inc
Hanley Flight & Zimmerman LLC
Lee Calvin
Nelms David
LandOfFree
Methods to fabricate semiconductor devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods to fabricate semiconductor devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods to fabricate semiconductor devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3500134