Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2006-01-20
2009-12-15
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
Reexamination Certificate
active
07633627
ABSTRACT:
Structure profiles from optical interferometric data can be identified by obtaining a plurality of broadband interferometric optical profiles of a structure as a function of structure depth in an axial direction. Each of the plurality of interferometric optical profiles include a reference signal propagated through a reference path and a sample signal reflected from a sample reflector in the axial direction. An axial position corresponding to at least a portion of the structure is selected. Phase variations of the plurality of interferometric optical profiles are determined at the selected axial position. A physical displacement of the structure is identified based on the phase variations at the selected axial position.
REFERENCES:
patent: 5153669 (1992-10-01), DeGroot
patent: 5398113 (1995-03-01), de Groot
patent: 6268916 (2001-07-01), Lee et al.
patent: 2002/0085209 (2002-07-01), Mittleman et al.
patent: 2004/0263859 (2004-12-01), Chang et al.
patent: WO 98/38901 (1998-09-01), None
Invitation to Pay Additional Fees and Partial International Search Report for application No. PCT/US2006/001936 mailed on May 29, 2006.
Arons et al. “Analysis of Fourier Synthesis Holography for Imaging Through Scattering Materials”Applied Optics34 (11): 1841-1847 (1995).
Blazkiewicz et al. “Signal-to-Noise Ratio Study of Full-Field Fourier-Domain Optical Coherence Tomography”Applied Optics44(36): 7722-7729 (2005).
Youngquist et al. “Optical Coherence Domain Reflectometry: A New Optical Evaluation Technique”Opt Lett12(3):158-160 (1987).
Takada et al. “New Measurement System for Fault Location in Optical Waveguide Devices Based on an Interferometric Technique”Applied Optics26(9): 1603-1606 (1987).
Danielson et al. “Guided-Wave Reflectometry with Micrometer Resolution”Applied Optics26(14): 2836-2842 (1987).
Choma Michael
Ellerbee Audrey
Izatt Joseph A.
Sarunic Marinko
Duke University
Myers Bigel & Sibley & Sajovec
Richey Scott M
Toatley Jr. Gregory J
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