Methods of testing memory devices

Details Methods of testing memory devices Methods of testing memory devices

2006-07-27

2009-06-23

Karlsen, Ernest F (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

07550985

ABSTRACT:
A testing apparatus, system and method for testing computer memory modules are disclosed. The apparatus includes a motherboard having a processor and at least one resident memory socket fixed to the motherboard. A remote memory socket is provided and located a distance from the resident memory socket, such as on a periphery of the motherboard. The remote memory socket is coupled to the resident memory socket by a conductor assembly such as a ribbon cable and an adapter. A memory module is placed in the remote memory socket and tested using a signal or combination of signals from the processor. A plurality of motherboards, each being configured with remote memory sockets, may be combined to form a testing system suitable for use with an automated handler.

REFERENCES:
patent: 2023947 (1935-12-01), Auble
patent: 2951185 (1960-08-01), Buck
patent: 3808532 (1974-04-01), Yuska
patent: 3829741 (1974-08-01), Athey
patent: 3850492 (1974-11-01), Moore
patent: 3904861 (1975-09-01), McNamara
patent: 4080028 (1978-03-01), Gilbert
patent: 4230986 (1980-10-01), Deaver et al.
patent: 4231629 (1980-11-01), Kirby
patent: 4573753 (1986-03-01), Vogl
patent: 4795977 (1989-01-01), Frost et al.
patent: 4862327 (1989-08-01), Ansell et al.
patent: 4924179 (1990-05-01), Sherman
patent: 5010446 (1991-04-01), Scannell
patent: 5257166 (1993-10-01), Marui et al.
patent: RE34491 (1993-12-01), Driller et al.
patent: 5283605 (1994-02-01), Lang-Dahlke
patent: 5430847 (1995-07-01), Bradley et al.
patent: 5523695 (1996-06-01), Lin
patent: 5524232 (1996-06-01), Hajeer
patent: 5537295 (1996-07-01), Van Den Bout et al.
patent: 5559672 (1996-09-01), Buras
patent: 5583749 (1996-12-01), Tredennick et al.
patent: 5625534 (1997-04-01), Okaya et al.
patent: 5667388 (1997-09-01), Cottrell
patent: 5764924 (1998-06-01), Hong
patent: 5781747 (1998-07-01), Smith et al.
patent: 5793620 (1998-08-01), Burnworth et al.
patent: 5822182 (1998-10-01), Scholder et al.
patent: 5853297 (1998-12-01), Moulton et al.
patent: 5919259 (1999-07-01), Dahl
patent: 5928024 (1999-07-01), Ming-Huang
patent: 6089879 (2000-07-01), Babcock
patent: 6216184 (2001-04-01), Fackenthall et al.

Affiliated with

Also associated with

Rating

Methods of testing memory devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of testing memory devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of testing memory devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4121590