Methods of testing electronic devices

Details Methods of testing electronic devices Methods of testing electronic devices

2006-01-10

2008-10-07

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07432729

ABSTRACT:
A method and system of testing an electronic device can be performed by estimating the die temperature using correlation data previously collected for other electronic devices. In one embodiment, correlation data can include (1) die temperatures measured and (2) currents drawn by the electronic devices, testing voltages for the electronic devices, or powers consumed by the electronic devices during the testing. The correlation data can be used to generate an equation or be stored in a table. A method of testing a subsequent electronic device can include testing the subsequent electronic device. The method can also include estimating a die temperature for the subsequent electronic device during testing, wherein the die temperature can be estimated at least in part using a current drawn by the subsequent electronic device, a testing voltage for the subsequent electronic device, or a power consumed by the subsequent electronic device.

REFERENCES:
patent: 5821505 (1998-10-01), Tustaniwskyj et al.
patent: 5844208 (1998-12-01), Tustaniwskyj et al.
patent: 5918665 (1999-07-01), Babcock et al.
patent: 6636063 (2003-10-01), Arnold et al.
patent: 6650132 (2003-11-01), Pelissier
patent: 6788084 (2004-09-01), Jones et al.
patent: 6825681 (2004-11-01), Feder
patent: 6879172 (2005-04-01), Eppes et al.
patent: 6886976 (2005-05-01), Gaasch et al.
patent: 6900650 (2005-05-01), Sheng et al.
patent: 2004/0204899 (2004-10-01), Gunther et al.
patent: 2005/0007136 (2005-01-01), Feder
patent: 2005/0036352 (2005-02-01), Norris
patent: 2005/0067146 (2005-03-01), Thayer et al.
patent: 2006/0290366 (2006-12-01), Kon et al.
patent: 2007/0108388 (2007-05-01), Lane et al.
patent: 2007/0138395 (2007-06-01), Lane et al.

Affiliated with

Also associated with

Rating

Methods of testing electronic devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Methods of testing electronic devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of testing electronic devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4001725