Electricity: measuring and testing – A material property using electrostatic phenomenon – For flaw detection
Reexamination Certificate
2011-03-08
2011-03-08
Natalini, Jeff (Department: 2858)
Electricity: measuring and testing
A material property using electrostatic phenomenon
For flaw detection
C324S457000, C235S488000
Reexamination Certificate
active
07902831
ABSTRACT:
Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a known voltage level. The discharge probe may then be discharged at a second location on the transaction card. A discharge wave shape may be recorded from the ground probe, and one of a pass condition and a fail condition may be assigned based on at least the value of the known voltage level as compared to a reference voltage level. The first location and the second location may each be selected from a plurality of areas on the transaction card.
REFERENCES:
patent: 5136247 (1992-08-01), Hansen
patent: 6189791 (2001-02-01), Takita et al.
patent: 2008/0265040 (2008-10-01), Holmes et al.
patent: 2009/0250521 (2009-10-01), Fujita et al.
patent: 2010/0065637 (2010-03-01), Top et al.
patent: 0 268 602 (1993-10-01), None
Weil G: “Characterization and Test Methods for Printed Circuit Board ESD,” 19900821; 19900821-19900823, Aug. 21, 1990, pp. 124-129, XP010008518, the whole document.
Ananymous: “Protecting Chip Cards Against Electrostatic Discharge,” IBM Technical Disclosure Bulletin, vol. 26, No. 10A, Mar. 1, 1984, pp. 5091-5093, XP002495472, New York, US, the whole document.
Fujiwara, O, et al.: “A Realistic FDTD Model for Simulating Electrostatic Discharge Test,” Radio Science Conference, 2004. Proceedings. 2004 Asia-Pacific Qingdao, China, Aug. 24-27, 2004, Piscataway, NY, USA IEEE, Aug. 24, 2004, pp. 523-523, XP010789383, ISBN: 978-0-7803-8404-0, the whole document.
Al Wallash et al: “Electrostatic Discharge Testing of Tunneling Magnetoresistive (TMR) Devices,” IEEE Transactions on Magnetics, IEEE Service Center, New York, NY, US, vol. 36, No. 5, Sep. 1, 2000, XP011033242, ISSN: 0018-9464, the whole document.
Huynh Dung
Kurtek Edward
Nelson Chris Stanley
Ras Johan
Top Mustafa Cemal
Natalini Jeff
Townsend and Townsend / and Crew LLP
VISA U.S.A. Inc.
LandOfFree
Methods of performing electrostatic discharge testing on a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods of performing electrostatic discharge testing on a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods of performing electrostatic discharge testing on a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2688431